.nist.gov (Standard Reference / public data, DCAT/NERDm). {"@context":["https://data.nist.gov/od/dm/nerdm-pub-context.jsonld",{"@base":"ark:/88434/mds10fc4vn"}],"_schema":"https://data.nist.gov/od/dm/nerdm-schema/v0.7#","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/PublicDataResource"],"@type":["nrdp:PublicDataResource"],"@id":"ark:/88434/mds10fc4vn","doi":"doi:10.18434/T4/1503069","title":"LTE Coverage Tool","contactPoint":{"fn":"Samuel Ray","hasEmail":"mailto:samuel.ray@nist.gov"},"modified":"2018-09-26","ediid":"758A5E930B207E05E05324570681A1181964","landingPage":"https://data.nist.gov/od/id/758A5E930B207E05E05324570681A1181964","description":["This experimental Android application was developed by NIST PSCR to enable public safety personnel to measure general LTE coverage quality using a standard smartphone. 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Abstract: Epitaxial strain can unlock enhanced properties in oxide materials but restricts substrate choice and maximum film thickness, above which lattice relaxation and property degradation occur. Here we employ a chemical alternative to epitaxial strain by providing targeted chemical pressure, distinct from random doping, to induce a ferroelectric instability with the strategic introduction of barium into today's best millimeter-wave tunable dielectric, the epitaxially strained 50 nm thick n = 6 (SrTiO3)nSrO Ruddlesden-Popper grown on (110) DyScO3. The defect mitigating nature of (SrTiO3)nSrO results in unprecedented low loss at frequencies up to 125 GHz. No barium-containing Ruddlesden-Popper titanates are known, but this atomically-engineered superlattice material, (SrTiO3)n?m(BaTiO3)mSrO, enables low-loss, tunable dielectric properties to be achieved with lower epitaxial strain and a 200 % improvement in the figure of merit at commercially-relevant millimeter-wave frequencies. As tunable dielectrics are key constituents for emerging millimeter-wave high-frequency devices in telecommunications our findings could lead to higher performance adaptive and reconfigurable electronics at these frequencies."],"keyword":["microwave","millimeter-wave","5G","targeted chemical pressure","materials","dielectric constant","loss tangent","permittivity","low loss","tunability","frequency-agile","filters","resonators","physical vapor","deposition","molecular beam epitaxy","strain engineering","barium","strontium","titanate","superlattice","ruddlesden-popper","DFT","density functional theory"],"theme":["Electronics: Optoelectronics","Advanced Communications: Wireless (RF)","Physics: Condensed matter","Metrology: Electrical/electromagnetic metrology","Materials: Materials characterization","Materials: Ceramics","Electronics: Thin-film electronics","Electronics: Electromagnetics"],"topic":[{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Electronics: Optoelectronics"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Advanced Communications: Wireless (RF)"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Physics: Condensed matter"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Metrology: Electrical/electromagnetic metrology"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Materials: Materials characterization"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Materials: Ceramics"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Electronics: Thin-film electronics"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Electronics: Electromagnetics"}],"accessLevel":"public","license":"https://www.nist.gov/open/license","components":[{"accessURL":"https://doi.org/10.18434/M31968","title":"DOI Access for Data for \"Targeted Chemical Pressure Yields Tunable Millimeter-Wave Dielectric \"","@type":["nrd:Hidden","dcat:Distribution"],"@id":"#doi:10.18434/M31968"},{"@id":"cmps/Fig2_X-ray_Diffraction_50_nm_samples.csv","@type":["nrdp:DataFile","nrdp:DownloadableFile","dcat:Distribution"],"_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"],"filepath":"Fig2_X-ray_Diffraction_50_nm_samples.csv","downloadURL":"https://data.nist.gov/od/ds/7619E70B50E70FE5E05324570681A1921968/Fig2_X-ray_Diffraction_50_nm_samples.csv","mediaType":"application/vnd.ms-excel","size":44976,"checksum":{"hash":"000ece9827b1d4c0ac87815d1bfd57aecdb4b38ae0fb66ff6899663638a29213","algorithm":{"tag":"sha256","@type":"Thing"}},"format":{"description":"CSV"},"description":"This CSV file contains the raw data for the X-ray diffraction curves shown in Figure 2. 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The files are included as .CIF files, for the paraelectric/ferroelectric films spanning from n=2 to n=6. Information in this folder can be extracted via archiving tools such as Gzip.","title":"Figure 1: DFT files for the Ba-containing STO Ruddlesden-Popper structures"},{"@id":"cmps/Fig4a_inset_Loss_tangent_100_nm_n6.csv","@type":["nrdp:DataFile","nrdp:DownloadableFile","dcat:Distribution"],"_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"],"filepath":"Fig4a_inset_Loss_tangent_100_nm_n6.csv","downloadURL":"https://data.nist.gov/od/ds/7619E70B50E70FE5E05324570681A1921968/Fig4a_inset_Loss_tangent_100_nm_n6.csv","mediaType":"application/vnd.ms-excel","size":9062,"checksum":{"hash":"8cb6c2ef9619319b0037333497fbeec7325cff2abb47aeac6f83c30a9f44d5b9","algorithm":{"tag":"sha256","@type":"Thing"}},"format":{"description":"CSV"},"description":"This CSV file contains the raw data for the loss tangent vs. frequency curves shown in the inset of Figure 4(a) for the 100 nm Ba-containing STO Ruddlesden-Popper films with n=6.","title":"Figure 4(a)[inset]: Data for the loss tangent vs. frequency curve for the 100 nm Ba-containing STO Ruddlesden-Popper films with n=6"},{"@id":"cmps/README.txt.sha256","@type":["nrdp:ChecksumFile","nrdp:DownloadableFile","dcat:Distribution"],"filepath":"README.txt.sha256","downloadURL":"https://data.nist.gov/od/ds/7619E70B50E70FE5E05324570681A1921968/README.txt.sha256","algorithm":{"tag":"sha256","@type":"Thing"},"describes":"cmps/README.txt","description":"SHA-256 checksum value for README.txt","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/ChecksumFile"],"mediaType":"text/plain","size":64,"checksum":{"hash":"15786a49e4a02e09636071071fba1d7b73bf6a96ba483a4dc94b4d521103baf4","algorithm":{"tag":"sha256","@type":"Thing"}},"valid":true},{"@id":"cmps/Fig3d_potential_well_n246.csv","@type":["nrdp:DataFile","nrdp:DownloadableFile","dcat:Distribution"],"_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/DataFile"],"filepath":"Fig3d_potential_well_n246.csv","downloadURL":"https://data.nist.gov/od/ds/7619E70B50E70FE5E05324570681A1921968/Fig3d_potential_well_n246.csv","mediaType":"application/vnd.ms-excel","size":821,"checksum":{"hash":"2ebd7e263f0ff44fa56a2644038fdc0d2aac5aa1ea0ba936c904db746071b9ff","algorithm":{"tag":"sha256","@type":"Thing"}},"format":{"description":"CSV"},"description":"This CSV file contains the raw data for the energy vs. total ionic distortion curves shown in Figure 3(d) for the Ba-containing STO Ruddlesden-Popper films from n=2-6. 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