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Finite Element Modeling of Materials with Complex Micros

tructure (OOF) NIST -- National Institute of Standards and Technology, data.nist.gov (Standard Reference / public data, DCAT/NERDm). {"@context":["https://data.nist.gov/od/dm/nerdm-pub-context.jsonld",{"@base":"ark:/88434/mds00n31b0"}],"_schema":"https://data.nist.gov/od/dm/nerdm-schema/v0.7#","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/PublicDataResource"],"@type":["nrdp:PublicDataResource","dcat:Dataset"],"@id":"ark:/88434/mds00n31b0","title":"Finite Element Modeling of Materials with Complex Microstructure (OOF)","contactPoint":{"hasEmail":"mailto:stephen.langer@nist.gov","fn":"Stephen Langer"},"modified":"2013-07-05","status":"available","ediid":"FDB5909746B65200E043065706813E54190","landingPage":"http://www.ctcms.nist.gov/oof/","description":["OOF is software for analyzing the properties of materials with complex microstructures. Starting with a micrograph of a real or simulated material, OOF allows users to assign material properties to features of the microstructure, to construct a finite element mesh from the microstructure geometry, and to perform virtual experiments on the microstructure."],"keyword":["microstructure","finite-elements","materials properties"],"theme":["Materials: Modeling and computational material science"],"topic":[{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Materials: Modeling and computational material science"}],"references":[{"@type":["deo:BibliographicReference"],"@id":"#ref:oof/oof1/index.html#Manual","refType":"IsSupplementTo","location":"http://www.ctcms.nist.gov/oof/oof1/index.html#Manual","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"]}],"accessLevel":"public","license":"https://www.nist.gov/open/license","inventory":[{"forCollection":"","childCount":2,"descCount":2,"byType":[{"forType":"dcat:Distribution","childCount":2,"descCount":2},{"forType":"nrdp:AccessPage","childCount":2,"descCount":2}],"childCollections":[]}],"components":[{"accessURL":"http://www.ctcms.nist.gov/oof/oof2/index.html#download","format":{"description":"application/x-gzip"},"mediaType":"application/gzip","@type":["nrdp:AccessPage","dcat:Distribution"],"@id":"#oof/oof2/index.html#download","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/AccessPage"]},{"accessURL":"http://www.ctcms.nist.gov/oof/oof3d/","mediaType":"application/gzip","@type":["nrdp:AccessPage","dcat:Distribution"],"@id":"#oof/oof3d/","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/AccessPage"]}],"publisher":{"@type":"org:Organization","name":"National Institute of Standards and Technology"},"language":["en"],"bureauCode":["006:55"],"programCode":["006:052"],"version":"1.0.0"},