rs in the photoionization of CO2 in the region between 650 Å and 840 Å - SRD 119 NIST -- National Institute of Standards and Technology, data.nist.gov (Standard Reference / public data, DCAT/NERDm). {"@context":["https://data.nist.gov/od/dm/nerdm-pub-context.jsonld",{"@base":"ark:/88434/mds00300bj"}],"_schema":"https://data.nist.gov/od/dm/nerdm-schema/v0.7#","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/PublicDataResource"],"@type":["nrd:SRD","nrdp:PublicDataResource","dcat:Dataset"],"@id":"ark:/88434/mds00300bj","title":"NIST Vibrational branching ratios and asymmetry parameters in the photoionization of CO2 in the region between 650 Å and 840 Å - SRD 119","contactPoint":{"hasEmail":"mailto:gerald.fraser@nist.gov","@type":"vcard:Contact","fn":"Gerald Fraser"},"modified":"2007-06-01","status":"available","ediid":"FDB59097466E5200E043065706813E54118","landingPage":"https://www.nist.gov/pml/photoionization-co2-arpes","description":["CO2 is studied using dispersed synchrotron radiation in the 650 Å and 840 Å spectral region. The vibrationally resolved photoelectron spectra are analyzed to generate relative vibrational transition amplitudes and the angular asymmetry parameters describing the various transitions observed."],"keyword":["ARPES","X ray photoelectron spectroscopy","photoelectron spectroscopy","physics","spectra"],"theme":["Standards: Reference data","Chemistry: Analytical chemistry","Physics: Atomic, molecular, and quantum"],"topic":[{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Standards: Reference data"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Chemistry: Analytical chemistry"},{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Physics: Atomic, molecular, and quantum"}],"references":[{"@type":["deo:BibliographicReference"],"@id":"#ref:pml/photoionization-co2-introduction","refType":"IsSupplementTo","location":"https://www.nist.gov/pml/photoionization-co2-introduction","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"]}],"accessLevel":"public","license":"https://www.nist.gov/open/license","inventory":[{"forCollection":"","childCount":1,"descCount":1,"byType":[{"forType":"dcat:Distribution","childCount":1,"descCount":1},{"forType":"nrdp:AccessPage","childCount":1,"descCount":1}],"childCollections":[]}],"components":[{"accessURL":"https://dx.doi.org/10.18434/T45C7B","mediaType":"text/html","@type":["nrdp:AccessPage","dcat:Distribution"],"@id":"#10.18434/T45C7B","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/AccessPage"]}],"publisher":{"@type":"org:Organization","name":"National Institute of Standards and Technology"},"language":["en"],"bureauCode":["006:55"],"programCode":["006:052"],"version":"1.0.0"},