20 NIST -- National Institute of Standards and Technology, data.nist.gov (Standard Reference / public data, DCAT/NERDm). {"@context":["https://data.nist.gov/od/dm/nerdm-pub-context.jsonld",{"@base":"ark:/88434/mds00mdfrm"}],"_schema":"https://data.nist.gov/od/dm/nerdm-schema/v0.7#","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/PublicDataResource"],"@type":["nrd:SRD","nrdp:PublicDataResource","dcat:Dataset"],"@id":"ark:/88434/mds00mdfrm","title":"NIST X-ray Photoelectron Spectroscopy Database XPS - SRD 20","contactPoint":{"hasEmail":"mailto:cedric.powell@nist.gov","@type":"vcard:Contact","fn":"Cedric Powell"},"modified":"2012-10-10","status":"available","ediid":"ECBCC1C130062ED9E04306570681B10712","landingPage":"https://srdata.nist.gov/xps/","description":["NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding energy, Auger kinetic energy, chemical shift, and surface or interface core-level shift), retrieval of data for selected compounds (according to chemical name, selected groups of elements, or chemical classes), display of Wagner plots, and retrieval of data by scientific citation. For the newer data records, additional information is provided on the specimen material, the conditions of measurement, and the analysis of the data. Version 4.1 contains new reference photoelectron binding energies, reference Auger-electron kinetic energies, and reference Auger parameters for many elemental solids. These reference energies were derived from analyses of Handbook data [C. J. Powell, J. Electron Spectrosc. Relat. Phenom. 185, 1 (2012)] and are used in calculations of chemical shifts."],"keyword":["Auger electron","Auger electron spectroscopy","Auger kinetic energy","Auger parameter","ESCA","XPS","doublet separation","electron spectroscopy for chemical analysis","material database","photoelectron","photoelectron spectroscopy","photoemission","surface analysis","X-ray photoelectron spectroscopy","Binding energies","Chemical shifts","Wagner plots"],"theme":["Standards: Reference data"],"topic":[{"@type":"Concept","scheme":"https://data.nist.gov/od/dm/nist-themes/v1.1","tag":"Standards: Reference data"}],"references":[{"@type":["deo:BibliographicReference"],"@id":"#ref:xps/intro.aspx","refType":"IsSupplementTo","location":"https://srdata.nist.gov/xps/intro.aspx","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"]},{"@type":["deo:BibliographicReference"],"@id":"#ref:articles/abstract/10.2481/dsj.1.1/","refType":"IsSupplementTo","location":"http://datascience.codata.org/articles/abstract/10.2481/dsj.1.1/","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"]},{"@type":["deo:BibliographicReference"],"@id":"#ref:10.1016/j.elspec.2011.12.001","refType":"IsSupplementTo","location":"https://dx.doi.org/10.1016/j.elspec.2011.12.001","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/bib/v0.7#/definitions/DCiteReference"]}],"accessLevel":"public","license":"https://www.nist.gov/open/license","inventory":[{"forCollection":"","childCount":1,"descCount":1,"byType":[{"forType":"dcat:Distribution","childCount":1,"descCount":1},{"forType":"nrdp:AccessPage","childCount":1,"descCount":1}],"childCollections":[]}],"components":[{"accessURL":"https://dx.doi.org/10.18434/T4T88K","mediaType":"text/html","title":"Homepage of NIST X-ray Photoelectron Spectroscopy Database","@type":["nrdp:AccessPage","dcat:Distribution"],"@id":"#10.18434/T4T88K","_extensionSchemas":["https://data.nist.gov/od/dm/nerdm-schema/pub/v0.7#/definitions/AccessPage"]}],"publisher":{"@type":"org:Organization","name":"National Institute of Standards and Technology"},"language":["en"],"bureauCode":["006:55"],"programCode":["006:052"],"version":"1.0.0"},